Refractive index dispersion measurement of absorbing layers from transmittance spectra

Refractive-index measurement of absorbing condensed media.

Control capability of electrolytic concentration on refractive index and dielectric constant of porous Silicon layers

Porous Silicon (PS) samples have been prepared by electrochemical anodization of p-type silicon wafer by varying HF concentrations in the electrolytic solution. The structural, surface morphological, optical and surface composition analysis of the prepared samples were done by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Photoluminescence (PL) and Fourier transform infr...

Control capability of electrolytic concentration on refractive index and dielectric constant of porous Silicon layers

Porous Silicon (PS) samples have been prepared by electrochemical anodization of p-type silicon wafer by varying HF concentrations in the electrolytic solution. The structural, surface morphological, optical and surface composition analysis of the prepared samples were done by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Photoluminescence (PL) and Fourier transform infr...

Measurement of the dispersion of air and of refractive index anomalies by wavelength-dependent nonlinear interferometry.

We carry out wavelength-dependent second harmonic interference experiments using thin films of an organic dye as nonlinear optical sources. While the measured difference of refractive index between the fundamental and second harmonic wavelengths follows the theoretical expectation for air in a wide spectral region, anomalous dispersion is observed when the second harmonic light lies in the abso...

Measurement of refractive index of PF-5060

For optical studies of boiling heat transfer process, it is essential that the refractive index and its dependence on temperature for the test liquid be known. In this work a simple set-up was built to measure the refractive index of Fluorinert Liquid PF-5060 with temperature compensation and temperature control. The pinhole laser light beam was used for determining the refraction angle. The re...